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An Approach to Remote Update Embedded Systems in the Internet of Things., , , , and . J. Internet Serv. Appl., 14 (1): 151-159 (January 2023)Permanent and single event transient faults reliability evaluation EDA tool., , , and . Microelectron. Reliab., (2016)Impact of schmitt trigger inverters on process variability robustness of 1-Bit full adders., , , and . ICECS, page 290-293. IEEE, (2017)Evaluating the impact of environment and physical variability on the ION current of 20nm FinFET devices., , and . PATMOS, page 1-8. IEEE, (2014)Fast and Low-Error Prediction of Logic Gate Cell Characterization., , , , and . ICECS, page 1-4. IEEE, (2023)Process Variability Impact on the SET Response of FinFET Multi-level Design., , , and . VLSI-SoC (Selected Papers), volume 586 of IFIP Advances in Information and Communication Technology, page 89-113. Springer, (2019)Temperature dependence and ZTC bias point evaluation of sub 20nm bulk multigate devices., , , and . ICECS, page 270-273. IEEE, (2017)Impact of different transistor arrangements on gate variability., , , , , and . Microelectron. Reliab., (2018)Guest Editorial Special Issue on the IEEE Latin American Symposium on Circuits and Systems (LASCAS 2023)., and . IEEE Trans. Circuits Syst. I Regul. Pap., 71 (3): 985-986 (March 2024)Robustness Analysis of 3-2 Adder Compressor Designed in 7-nm FinFET Technology., , , , , , and . IEEE Trans. Circuits Syst. II Express Briefs, 70 (3): 1264-1268 (March 2023)