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Disambiguation of "Yamamori, Hirotake"

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Precision AC-DC Difference Measurement System Based on a Programmable Josephson Voltage Standard.

, , , , and . IEEE Trans. Instrumentation and Measurement, 60 (7): 2439-2444 (2011)

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Fusako Sophie Yamamori

 

Other publications of authors with the same name

NbN-Based Overdamped Josephson Junctions for Quantum Voltage Standards., , , and . IEICE Trans. Electron., 95-C (3): 329-336 (2012)Adjustable SQUID-resonator direct coupling in microwave SQUID multiplexer for TES microcalorimeter array., , , , , , and . IEICE Electron. Express, 14 (11): 20170271 (2017)Evaluation of Low-Frequency Characteristic of a Thermal Converter Using Programmable Josephson Voltage Standard., , , , , , and . IEEE Trans. Instrum. Meas., 59 (11): 2930-2935 (2010)Measurement of thermoelectric effects in a thermal converter using a NbN/TiN/NbN Josephson junction array., , , , and . IEEE Trans. Instrumentation and Measurement, 52 (2): 359-362 (2003)Comparison of a Multichip 10-V Programmable Josephson Voltage Standard System With a Superconductor-Insulator-Superconductor-Based Conventional System., , , , , , , and . IEEE Trans. Instrumentation and Measurement, 58 (4): 832-837 (2009)Programmable Josephson voltage standard circuits using arrays of NbN/TiN/NbN/TiN/NbN double-junction stacks operated at 10 K., , , , and . IEEE Trans. Instrumentation and Measurement, 54 (2): 620-623 (2005)Calibration System for Zener Voltage Standards Using a 10 V Programmable Josephson Voltage Standard at NMIJ., , , , , and . IEEE Trans. Instrumentation and Measurement, 64 (6): 1606-1612 (2015)A precise evaluation of NbN-based 1-V programmable Josephson voltage standard arrays., , , , , and . IEEE Trans. Instrumentation and Measurement, 54 (2): 645-648 (2005)2.6-V high-resolution programmable Josephson voltage standard circuits using double-stacked MoSi2-barrier junctions., , , , , and . IEEE Trans. Instrum. Meas., 54 (2): 616-619 (2005)Reliable packaging of Josephson voltage standard circuit for cryocooler operation., , , and . IEICE Electron. Express, 16 (12): 20190219 (2019)