Author of the publication

Helper Data Algorithms for PUF-Based Key Generation: Overview and Analysis.

, , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 34 (6): 889-902 (2015)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

Fault Injection Modeling Attacks on 65 nm Arbiter and RO Sum PUFs via Environmental Changes., and . IEEE Trans. Circuits Syst. I Regul. Pap., 61-I (6): 1701-1713 (2014)Attacking PUF-Based Pattern Matching Key Generators via Helper Data Manipulation., and . IACR Cryptology ePrint Archive, (2013)A Privacy-Preserving Device Tracking System Using a Low-Power Wide-Area Network., , , , , , , , , and 1 other author(s). CANS, volume 11261 of Lecture Notes in Computer Science, page 347-369. Springer, (2017)Key-recovery attacks on various RO PUF constructions via helper data manipulation., and . DATE, page 1-6. European Design and Automation Association, (2014)Threshold Implementations Are Not Provably Secure Against Fault Sensitivity Analysis.. IACR Cryptology ePrint Archive, (2020)Fault Injection Modeling Attacks on 65nm Arbiter and RO Sum PUFs via Environmental Changes., and . IACR Cryptology ePrint Archive, (2013)Key-recovery Attacks on Various RO PUF Constructions via Helper Data Manipulation., and . IACR Cryptology ePrint Archive, (2013)Attacking PUF-Based Pattern Matching Key Generators via Helper Data Manipulation., and . CT-RSA, volume 8366 of Lecture Notes in Computer Science, page 106-131. Springer, (2014)Security Analysis of PUF-based Key Generation and Entity Authentication ; Veiligheidsanalyse van PUF-gebaseerde sleutelgeneratie en entiteitsauthenticatie.. Katholieke Universiteit Leuven, Belgium, (2017)base-search.net (ftunivleuven:oai:lirias.kuleuven.be:123456789/581770).IoT: Source of test challenges., , , , , , , , , and 4 other author(s). ETS, page 1-10. IEEE, (2016)