Author of the publication

Reference Calibration of Body-Voltage Sensing Circuit for High-Speed STT-RAMs.

, , , and . IEEE Trans. Circuits Syst. I Regul. Pap., 60-I (11): 2932-2939 (2013)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

Nearly Exact Analytical Formulation of the DNL Yield of the Digital-to-Analog Converter., and . IEEE Trans. Circuits Syst. II Express Briefs, 59-II (9): 563-567 (2012)Male Adolescents' and Young Adults' Evaluations of Interracial Exclusion in Offline and Online Settings., , , , and . Cyberpsychology Behav. Soc. Netw., 22 (10): 641-647 (2019)A 180mW 56Gb/s DSP-Based Transceiver for High Density IOs in Data Center Switches in 7nm FinFET Technology., , , , , , , , , and 9 other author(s). ISSCC, page 118-120. IEEE, (2019)A digitally-calibrated 10GS/s reconfigurable flash ADC in 65-nm CMOS., , , and . ISCAS, page 2443-2447. IEEE, (2013)Stability Estimation of a 6T-SRAM Cell Using a Nonlinear Regression., and . IEEE Trans. Very Large Scale Integr. Syst., 22 (1): 27-38 (2014)A 4.63pJ/b 112Gb/s DSP-Based PAM-4 Transceiver for a Large-Scale Switch in 5nm FinFET., , , , , , , , , and 11 other author(s). ISSCC, page 110-111. IEEE, (2023)A 3.8 mW/Gbps quad-channel 8.5-13 Gbps serial link with a 5-tap DFE and a 4-tap transmit FFE in 28 nm CMOS., , , , , , , , , and 3 other author(s). VLSIC, page 348-. IEEE, (2015)Reference Calibration of Body-Voltage Sensing Circuit for High-Speed STT-RAMs., , , and . IEEE Trans. Circuits Syst. I Regul. Pap., 60-I (11): 2932-2939 (2013)An INL Yield Model of the Digital-to-Analog Converter., and . IEEE Trans. Circuits Syst. I Regul. Pap., 60-I (3): 582-592 (2013)A 3.8 mW/Gbps Quad-Channel 8.5-13 Gbps Serial Link With a 5 Tap DFE and a 4 Tap Transmit FFE in 28 nm CMOS., , , , , , , , , and 3 other author(s). IEEE J. Solid State Circuits, 51 (4): 881-892 (2016)