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Analytical Models for the Evaluation of Resistive Short Defect Detectability in Presence of Process Variations: Application to 28nm Bulk and FDSOI Technologies.

, , , , и . J. Electron. Test., 35 (1): 59-75 (2019)

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Michel Georg Michel

Michel Ghazal

Prognostische Relevanz der Schildwächterlymphknotenbiopsie beim malignen Melanom. MedH Hannover, (2009)

Christine Michel

Malaise dans l'érotisme: Darstellungen sexueller Praktiken und Formen in der französischsprachigen Literatur der Gegenwart. Uni Marburg, (2008)

Michel Rocco

Sara Michel

 

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A high accuracy triangle-wave signal generator for on-chip ADC testing., , , и . ETW, стр. 89-94. IEEE Computer Society, (2002)Fully digital test solution for a set of ADCs and DACs embedded in a SIP or SOC., , , , , и . IET Comput. Digit. Tech., 1 (3): 146-153 (2007)Guest Editorial., , и . J. Electron. Test., 21 (3): 203 (2005)A New FPGA for DSP Applications Integrating BIST Capabilities., , , и . J. Electron. Test., 20 (4): 423-431 (2004)On the detectability of CMOS floating gate transistor faults., , , , и . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 20 (1): 116-128 (2001)A Specific Test Methodology for Symmetric SRAM-Based FPGAs.. FPL, том 1896 из Lecture Notes in Computer Science, стр. 300-311. Springer, (2000)Smart selection of indirect parameters for DC-based alternate RF IC testing., , , , , , , и . VTS, стр. 19-24. IEEE Computer Society, (2012)New implementions of predictive alternate analog/RF test with augmented model redundancy., , , , , и . DATE, стр. 1-4. European Design and Automation Association, (2014)Evaluation of indirect measurement selection strategies in the context of analog/RF alternate testing., , , , , и . LATW, стр. 1-6. IEEE, (2014)Impact of Simultaneous Switching Noise on the Static behavior of Digital CMOS Circuits., , и . ATS, стр. 239-244. IEEE, (2007)