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A self-binning BIST structure for data communications transceivers., , and . IEEE Trans. Instrumentation and Measurement, 52 (5): 1399-1407 (2003)An Experimental Study Comparing 74LS181 Test Sets., , and . COMPCON, page 384-387. IEEE Computer Society, (1985)Embedded test control schemes for compression in SOCs., , and . DAC, page 679-684. ACM, (2002)Self-reset logic for fast arithmetic applications., and . IEEE Trans. Very Large Scale Integr. Syst., 13 (4): 462-475 (2005)Gate-to-channel shorts in BiCMOS logic gates., and . VTS, page 440-445. IEEE Computer Society, (1994)Embedded test control schemes using iBIST for SOCs., , and . IEEE Trans. Instrumentation and Measurement, 54 (3): 956-964 (2005)On the Reliability of the IBM MVS/XA Operating., and . IEEE Trans. Software Eng., 13 (10): 1135-1139 (1987)Crosstalk induced fault analysis in DRAMs., and . SoCC, page 171-172. IEEE, (2004)Design-for-testability for embedded delay-locked loops., and . IEEE Trans. Very Large Scale Integr. Syst., 13 (8): 984-988 (2005)Compression Technique for Interactive BIST Application., and . VTS, page 9-14. IEEE Computer Society, (2001)