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A macro SPICE model for 2-bits/cell split-gate flash memory cell.

X. Liu, Y. Xu, X. Fan, M. Liao, P. Li, and S. Zou. Microelectron. J., (2017)

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Shichang Wang

Yang Zou

Peiguo Zou

Yang Zou

Other publications of authors with the same name

Impact of within-wafer process variability on radiation response.Z. Hu, Z. Liu, H. Shao, Z. Zhang, B. Ning, M. Chen, D. Bi, and S. Zou. Microelectron. J., 42 (6): 883-888 (2011)Demonstration of improvement of specific on-resistance versus breakdown voltage tradeoff for low-voltage power LDMOS.Z. Xu, D. Liu, J. Hu, F. Jin, X. Yang, W. Duan, W. Yue, Z. Fang, W. Qian, W. Kong and 1 other author(s). Microelectron. J., (2019)Degradation induced by TID radiation and hot-carrier stress in 130-nm short channel PDSOI NMOSFETs.L. Dai, X. Liu, M. Zhang, L. Zhang, Z. Hu, D. Bi, Z. Zhang, and S. Zou. Microelectron. Reliab., (2017)Influences of silicon-rich shallow trench isolation on total ionizing dose hardening and gate oxide integrity in a 130 nm partially depleted SOI CMOS technology.L. Song, Z. Hu, M. Zhang, X. Liu, L. Dai, Z. Zhang, and S. Zou. Microelectron. Reliab., (2017)A High-Performance and Low-Cost Single-Event Multiple-Node-Upsets Resilient Latch Design.Z. Liu, H. Zhang, J. Jiang, Y. Jia, Y. Xie, S. Zou, and Z. Zhang. IEEE Trans. Very Large Scale Integr. Syst., 30 (12): 1867-1877 (2022)A highly stable and low-cost 12T radiation hardened SRAM cell design for aerospace application.Z. Liu, Y. Xie, T. Xu, Q. Liu, D. Bi, Z. Hu, S. Zou, and Z. Zhang. Int. J. Circuit Theory Appl., 51 (8): 3938-3948 (August 2023)A charge pump system with new regulation and clocking scheme.W. Zhu, J. Jiang, D. Lin, J. Xiao, G. Yang, X. Li, and S. Zou. IEICE Electron. Express, 16 (4): 20190005 (2019)Substrate effect on radiation-induced charge trapping in buried oxide for partially-depleted SOI NMOSFET.H. Zhu, D. Bi, X. Xie, Z. Hu, Z. Zhang, and S. Zou. IEICE Electron. Express, 17 (7): 20200001 (2020)Radiation-enhanced channel length modulation induced by trapped charges in buried oxide layer.X. Xie, H. Zhu, M. Zhang, D. Bi, Z. Hu, Z. Zhang, and S. Zou. IEICE Electron. Express, 16 (21): 20190454 (2019)Bias dependence of TID radiation responses of 0.13 μm partially depleted SOI NMOSFETs.B. Ning, D. Bi, H. Huang, Z. Zhang, Z. Hu, M. Chen, and S. Zou. Microelectron. Reliab., 53 (2): 259-264 (2013)

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Disambiguation of "Zou, Shichang"

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A macro SPICE model for 2-bits/cell split-gate flash memory cell.

Please choose a person to relate this publication to

Shichang Wang

Shichang Wang

Yang Zou

Peiguo Zou

Yang Zou

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Zou, Shichang"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML A macro SPICE model for 2-bits/cell split-gate flash memory cell.

Please choose a person to relate this publication to

Shichang Wang

Shichang Wang

Yang Zou

Peiguo Zou

Yang Zou

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
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URL
DOI
BibTeX
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APA
Chicago
DIN 1505
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A macro SPICE model for 2-bits/cell split-gate flash memory cell.