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RF CMOS reliability simulations., , , and . Microelectron. Reliab., 48 (8-9): 1581-1585 (2008)Observations on the recovery of hot carrier degradation of hydrogen/deuterium passivated nMOSFETs., , and . Microelectron. Reliab., (2017)Reduced temperature dependence of hot carrier degradation in deuterated nMOSFETs., , , and . Microelectron. Reliab., 46 (9-11): 1617-1622 (2006)Effect of Ambient on the Recovery of Hot-Carrier Degraded Devices., , and . IRPS, page 1-6. IEEE, (2020)Micro- and nano-link ultra-low power heaters for sensors., , , , , and . ESSDERC, page 169-172. IEEE, (2012)Towards understanding recovery of hot-carrier induced degradation., , and . Microelectron. Reliab., (2018)Role of junction depth in light emission from silicon p-i-n leds., , , , and . ESSDERC, page 119-122. IEEE, (2013)Reliability aspects of a radiation detector fabricated by post-processing a standard CMOS chip., , , and . Microelectron. Reliab., 48 (8-9): 1139-1143 (2008)Identifying failure mechanisms in LDMOS transistors by analytical stability analysis., , , , , , and . ESSDERC, page 321-324. IEEE, (2014)Silicon LEDs in FinFET technology., , , , , and . ESSDERC, page 274-277. IEEE, (2014)