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Design of Radiation Hardened RADFET Readout System for Space Applications., , , , , , , , , and 4 other author(s). DSD, page 484-488. IEEE, (2020)Towards a Smart Multi-Sensor Ionizing Radiation Monitoring System., , , , , , , , , and 8 other author(s). DSD, page 286-293. IEEE, (2023)A design concept for radiation hardened RADFET readout system for space applications., , , , , , , , , and 4 other author(s). Microprocess. Microsystems, (April 2022)Analysis of Single Event Transient Effects in Standard Delay Cells Based on Decoupling Capacitors., , , , , , , , , and . J. Circuits Syst. Comput., 31 (18): 2240007:1-2240007:24 (December 2022)Automatic and reliable electrical characterization of MOSFETs., , and . DDECS, page 262-265. IEEE Computer Society, (2014)Response of Commercial P-Channel Power VDMOS Transistors to Ionizing Irradiation and Bias Temperature Stress., , , , , , , , , and 4 other author(s). J. Circuits Syst. Comput., 31 (18): 2240003:1-2240003:25 (December 2022)Circuit-Level Simulation of the Single Event Transients in an On-Chip Single Event Latchup Protection Switch., , , , and . J. Electron. Test., 31 (3): 275-289 (2015)Simulation-Based Analysis of the Single Event Transient Response of a Single Event Latchup Protection Switch., , , , and . DDECS, page 255-258. IEEE Computer Society, (2015)Floating-Gate MOS Transistor with Dynamic Biasing as a Radiation Sensor., , , and . Sensors, 20 (11): 3329 (2020)SET response of a SEL protection switch for 130 and 250 nm CMOS technologies., , , , , and . IOLTS, page 185-190. IEEE, (2016)