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Disambiguation of "Nouet, Pascal"

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Impact of Technology Spreading on MEMS design Robustness.

, , , , , , and . VLSI-SOC, volume 218 of IFIP Conference Proceedings, page 241-251. Kluwer, (2001)

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Pascal Vogel

Pascal Siegers

Pascal Blümmel

Pascal Häller

Pascal Bastian

 

Other publications of authors with the same name

Sensitivity and power modeling of CMOS mems single axis convective accelerometers., , , , , and . Microelectron. J., 44 (12): 1092-1098 (2013)Rejection of Power Supply Noise in Wheatstone Bridges : Application to Piezoresistive MEMS, , , , and . CoRR, (2008)Testing Resonant Micro-Electro-Mechanical Sensors using the Oscillation-based Test Methodology., , , and . LATW, page 99-104. IEEE, (2002)An electrical test method for MEMS convective accelerometers: Development and evaluation., , , , and . DATE, page 806-811. IEEE, (2011)A CMOS Multi-sensor System for 3D Orientation Determination., , , , and . ISVLSI, page 57-62. IEEE Computer Society, (2008)Per peers learning educational approach to teach industrial test to undergraduate students., , and . EWME, page 1-6. IEEE, (2016)Integrated Circuits Testing: Remote Access to Test Equipment for Labs and Engineering., , and . Int. J. Online Eng., 5 (S1): 43-50 (2009)A Strategy for Optimal Test Point Insertion in Analog Cascaded Filters., , , and . J. Electron. Test., 21 (1): 9-16 (2005)Characterization of the transient behavior of gated/STI diodes and their associated BJT in the CDM time domain., , , , and . Microelectron. Reliab., 49 (12): 1424-1432 (2009)Electro-thermal short pulsed simulation for SOI technology., , , , and . Microelectron. Reliab., 46 (9-11): 1482-1485 (2006)