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Concurrent device/circuit aging for general reliability simulations.

H. Jiang, C. Ma, L. Zhang, and M. Chan. ISIC, page 1-4. IEEE, (2016)

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Yuzhao Ma

Characterization of higher order modes in optical fibersY. Ma. Uni Erlangen-Nürnberg, (2009)

Jingxiang Ma

Tsie Ma

Lan Ma

Ma Li

Other publications of authors with the same name

CongestNN: An Bi-Directional Congestion Prediction Framework for Large-Scale Heterogeneous FPGAs.C. Ma, Y. Xiao, S. Wang, J. Yu, and J. Chen. ASICON, page 1-4. IEEE, (2021)Temperature dependence of the interface state distribution due to hot carrier effect in FinFET device.C. Ma, H. Wang, C. Zhang, X. Zhang, J. He, and X. Zhang. Microelectron. Reliab., 50 (8): 1077-1080 (2010)A universal approach for signal dependent circuit reliability simulation.L. Zhang, C. Ma, and M. Chan. ASICON, page 476-479. IEEE, (2017)Concurrent device/circuit aging for general reliability simulations.H. Jiang, C. Ma, L. Zhang, and M. Chan. ISIC, page 1-4. IEEE, (2016)A physical based model to predict performance degradation of FinFET accounting for interface state distribution effect due to hot carrier injection.C. Ma, L. Zhang, C. Zhang, X. Zhang, J. He, and X. Zhang. Microelectron. Reliab., 51 (2): 337-341 (2011)Late Breaking Results: Incremental 3D Global Routing Considering Cell Movement.P. Zou, Z. Lin, C. Ma, J. Yu, and J. Chen. DAC, page 1366-1367. IEEE, (2021)CNN-inspired analytical global placement for large-scale heterogeneous FPGAs.H. Wang, X. Tong, C. Ma, R. Shi, J. Chen, K. Wang, J. Yu, and Y. Chang. DAC, page 637-642. ACM, (2022)A unified FinFET reliability model including high K gate stack dynamic threshold voltage, hot carrier injection, and negative bias temperature instability.C. Ma, B. Li, L. Zhang, J. He, X. Zhang, X. Lin, and M. Chan. ISQED, page 7-12. IEEE Computer Society, (2009)Asymmetric issues of FinFET device after hot carrier injection and impact on digital and analog circuits.C. Ma, H. Wang, X. Zhang, F. He, Y. He, X. Zhang, and X. Lin. ISQED, page 432-436. IEEE, (2010)

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Disambiguation of "Ma, Chenyue"

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Concurrent device/circuit aging for general reliability simulations.

Please choose a person to relate this publication to

Yuzhao Ma

Jingxiang Ma

Tsie Ma

Lan Ma

Ma Li

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Ma, Chenyue"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Concurrent device/circuit aging for general reliability simulations.

Please choose a person to relate this publication to

Yuzhao Ma

Jingxiang Ma

Tsie Ma

Lan Ma

Ma Li

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
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Concurrent device/circuit aging for general reliability simulations.