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An Ultra-Fast, On-Chip BiST for RF Low Noise Amplifiers.

, , , and . VLSI Design, page 485-490. IEEE Computer Society, (2005)

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Towards Fault-Tolerant RF Front Ends., , , and . J. Electron. Test., 22 (4-6): 371-386 (2006)Passive and Active Reduction Techniques for On-Chip High-Frequency Digital Power Supply Noise., , , , , and . IEEE Trans. Very Large Scale Integr. Syst., 18 (1): 157-161 (2010)A differential summing amplifier for analog VLSI systems., and . ISCAS (4), page 57-60. IEEE, (2002)Self-calibration of input-match in RF front-end circuitry., , , and . IEEE Trans. Circuits Syst. II Express Briefs, 52-II (12): 821-825 (2005)Dynamic Input Match Correction in RF Low Noise Amplifiers., , , and . DFT, page 211-219. IEEE Computer Society, (2004)Demo Abstract: Perception vs. Reality - Never Believe in What You See., , , , , , , , , and 6 other author(s). IPSN, page 363-364. IEEE, (2020)Use of source degeneration for non-intrusive BIST of RF front-end circuits., , , and . ISCAS (5), page 4385-4388. IEEE, (2005)A current based self-test methodology for RF front-end circuits., , and . Microelectron. J., 36 (12): 1091-1102 (2005)A new wide range Euclidean distance circuit for neural network hardware implementations., and . IEEE Trans. Neural Networks, 14 (5): 1176-1186 (2003)A Current Sensor for On-Chip, Non-Intrusive Testing of RF Systems., , , and . VLSI Design, page 1023-1026. IEEE Computer Society, (2004)