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Macro Testing: Unifying IC and Board Test., , , , and . IEEE Des. Test, 3 (6): 26-32 (1986)Implementing Macro Test in Silicon Compiler Design., , , and . IEEE Des. Test Comput., 7 (2): 41-51 (1990)A Testability Strategy for Silicon Compilers., , , and . ITC, page 660-669. IEEE Computer Society, (1989)Minimizing Test Time by Exploiting Parallelism in Macro Test., , , , , and . ITC, page 451-460. IEEE Computer Society, (1993)Macro Testability: The Results of Production Device Applications., , , , and . ITC, page 232-241. IEEE Computer Society, (1992)Systematic and Structured Methods for Digital Board Testing.. ITC, page 380-385. IEEE Computer Society, (1985)Design-for-testability of PLA's using statistical cooling., , and . DAC, page 339-345. IEEE Computer Society Press, (1986)Fault Modeling and Test Algorithm Development., , and . ITC, page 343-352. IEEE Computer Society, (1988)A Realistic Self-Test Machine for Static Random Access Memories., , and . ITC, page 353-361. IEEE Computer Society, (1988)A realistic fault model and test algorithms for static random access memories., , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 9 (6): 567-572 (1990)