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Study of influence of failure modes on lifetime distribution prediction of 1.55 μm DFB Laser diodes using weak drift of monitored parameters during ageing tests.

L. Mendizabal, L. Béchou, Y. Deshayes, F. Verdier, Y. Danto, D. Laffitte, J. Goudard, and F. Houé. Microelectron. Reliab., 44 (9-11): 1337-1342 (2004)

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Yannick Antoniazza

Yannick Zakowski

Yannick Carlinet

Yannick Grondin

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