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Diagnosis of assembly failures for System-in-Package RF tuners., , and . ISCAS, page 2286-2289. IEEE, (2008)A First Step for an INL Spectral-Based BIST: The Memory Optimization., , , and . J. Electron. Test., 22 (4-6): 351-357 (2006)Solutions for the self-adaptation of communicating systems in operation., , , , , , , , , and 5 other author(s). IOLTS, page 234-239. IEEE, (2014)ADC Production Test Technique Using Low-Resolution Arbitrary Waveform Generator., , , , , , and . VLSI Design, (2008)High throughput non-contact SiP testing., , , , , , , , , and 1 other author(s). ITC, page 1-10. IEEE Computer Society, (2007)System-in-Package, a Combination of Challenges and Solutions., , and . ETS, page 193-199. IEEE Computer Society, (2007)Efficient Objective Metric Tool for Medical Electrical Device Development: Eye Phantom for Glaucoma Diagnosis Device., , , , , and . J. Sensors, (2017)Fully digital test solution for a set of ADCs and DACs embedded in a SIP or SOC., , , , , and . IET Comput. Digit. Tech., 1 (3): 146-153 (2007)Using Signal Envelope Detection for Online and Offline RF MEMS Switch Testing., , , , , and . VLSI Design, (2008)Änalogue Network of Converters": A DFT Technique to Test a Complete Set of ADCs and DACs Embedded in a Complex SiP or SOC., , , , , and . ETS, page 159-164. IEEE Computer Society, (2006)