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Phase estimation using sine fitting with low number of samples is biased in the presence of additive noise. Global Journal of Engineering and Technology Advances, 17 (2): 120–130 (февраля 2024)Better approximation for the precision of the number of counts in the histogram test of ADCs. Global Journal of Engineering and Technology Advances, 17 (1): 123–129 (февраля 2024)Performance analysis of an ADC histogram test using small triangular waves., , , и . IEEE Trans. Instrumentation and Measurement, 51 (4): 723-729 (2002)Overdrive in the ramp histogram test of ADCs., и . IEEE Trans. Instrumentation and Measurement, 54 (6): 2305-2309 (2005)Influence of frequency errors in the variance of the cumulative histogram in ADC testing., и . IEEE Trans. Instrumentation and Measurement, 50 (2): 461-464 (2001)Variance of the cumulative histogram of ADCs due to frequency errors., и . IEEE Trans. Instrumentation and Measurement, 52 (1): 69-74 (2003)Effective ADC linearity testing using sinewaves., , , , и . IEEE Trans. Circuits Syst. I Regul. Pap., 52-I (7): 1267-1275 (2005)Uncertainty of ADC random noise estimates obtained with the IEEE 1057 standard test., и . IEEE Trans. Instrumentation and Measurement, 54 (1): 110-116 (2005)Automatic calibration of analog and digital measuring instruments using computer vision., и . IEEE Trans. Instrumentation and Measurement, 49 (1): 94-99 (2000)ADC Histogram Test Using Triangular Stimulus Signals. Global Journal of Engineering and Technology Advances, 16 (3): 121–133 (февраля 2024)