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Disambiguation of "Dilhaire, Stefan"

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Characterization of the thermal behavior of PN thermoelectric couples by scanning thermal microscope.

, , , , , , and . Microelectron. J., 35 (10): 797-803 (2004)

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Stefan Schwärzler

Graphische Modelle im natürlichsprachlichen Mensch-Maschine-Dialog. TU München, (2010)

Stefan Weiß

Deformation quantization of principal fibre bundles and classical gauge theories. Uni Freiburg, (2009)

Stefan Fröhlich

Modellbasierte Fehlererkennung und Diagnose in Echtzeit am Beispiel einer Brennstoffzelle. Uni Kassel, (2009)

Stefan Tripmaker

Verhältnis und Abgrenzung zwischen Steuerhinterziehung und Betrug. Bucerius Law School Hamburg, (2007)

Stefan Kutter

Molekularer Aufbau und Translokationsmechanismus des Cag-Typ-IV-Sekretionssystems von Helicobacter pylori. Uni München, (2009)
 

Other publications of authors with the same name

Strain energy imaging of a power MOS transistor using speckle interferometry., , , and . IEEE Trans. Reliab., 53 (2): 293-296 (2004)Temperature measurements of metal lines under current stress by high-resolution laser probing., , , and . IEEE Trans. Instrumentation and Measurement, 48 (1): 69-74 (1999)Sensing temperature in CMOS circuits for Thermal Testing., , , , , , and . VTS, page 179-184. IEEE Computer Society, (2004)Characterization of the thermal behavior of PN thermoelectric couples by scanning thermal microscope., , , , , , and . Microelectron. J., 35 (10): 797-803 (2004)Laser diode COFD analysis by thermoreflectance microscopy., , , , , and . Microelectron. Reliab., 41 (9-10): 1597-1601 (2001)Comparison of thermoreflectance and scanning thermal microscopy for microelectronic device temperature variation imaging: Calibration and resolution issues., , , , , and . Microelectron. Reliab., 48 (2): 204-211 (2008)Using Temperature as Observable of the Frequency Response of RF CMOS Amplifiers., , , , , , , , , and 1 other author(s). ETS, page 47-52. IEEE Computer Society, (2008)Determination of passive SiO2-Au microstructure resonant frequencies., , , and . Microelectron. Reliab., 43 (9-11): 1951-1955 (2003)Electro-thermal characterization of a differential temperature sensor in a 65 nm CMOS IC: Applications to gain monitoring in RF amplifiers., , , , , , , , , and 2 other author(s). Microelectron. J., 45 (5): 484-490 (2014)ElectroStatic Discharge Fault Localization by Laser Probing., , , , and . Microelectron. Reliab., 45 (9-11): 1482-1486 (2005)