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Efficient Tests for Realistic Faults in Dual-Port SRAMs.

, and . IEEE Trans. Computers, 51 (5): 460-473 (2002)

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Functional Tests for Ring-Address SRAM-type FIFOs., , and . EDAC-ETC-EUROASIC, page 666. IEEE Computer Society, (1994)Efficient Tests for Realistic Faults in Dual-Port SRAMs., and . IEEE Trans. Computers, 51 (5): 460-473 (2002)DOAS: an object oriented architecture supporting secure languages., and . MICRO, page 127-134. ACM/IEEE, (1989)MBIST architecture framework based on orthogonal constructs., and . IDT, page 128-133. IEEE, (2010)Computer architecture and design.. Electronic systems engineering series Addison-Wesley, (1989)Memory testing with a RISC microcontroller., , and . DATE, page 214-219. IEEE Computer Society, (2010)