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A generic fault prognostics algorithm for manufacturing industries using unsupervised machine learning classifiers.

N. Kolokas, T. Vafeiadis, D. Ioannidis, and D. Tzovaras. Simul. Model. Pract. Theory, (2020)

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Viktor Vafeiadis

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A Deep Learning framework for simulation and defect prediction applied in microelectronics.N. Dimitriou, L. Leontaris, T. Vafeiadis, D. Ioannidis, T. Wotherspoon, G. Tinker, and D. Tzovaras. Simul. Model. Pract. Theory, (2020)Anomaly Detection in Aluminium Production with Unsupervised Machine Learning Classifiers.N. Kolokas, T. Vafeiadis, D. Ioannidis, and D. Tzovaras. INISTA, page 1-6. IEEE, (2019)Intelligent Information Management System for Decision Support: Application in a Lift Manufacturer's Shop Floor.T. Vafeiadis, A. Nizamis, K. Apostolou, V. Charisi, I. Metaxa, T. Mastos, D. Ioannidis, A. Papadopoulos, and D. Tzovaras. INISTA, page 1-6. IEEE, (2019)Data Analytics Platform for the Optimization of Waste Management Procedures.T. Vafeiadis, A. Nizamis, V. Pavlopoulos, L. Giugliano, V. Rousopoulou, D. Ioannidis, and D. Tzovaras. DCOSS, page 333-338. IEEE, (2019)Towards the behavior analysis of chemical reactors utilizing data-driven trend analysis and machine learning techniques.E. Lithoxoidou, C. Ziogou, T. Vafeiadis, S. Krinidis, D. Ioannidis, S. Voutetakis, and D. Tzovaras. Appl. Soft Comput., (2020)Malfunction diagnosis in industrial process systems using data mining for knowledge discovery.E. Lithoxoidou, T. Vafeiadis, S. Krinidis, D. Ioannidis, D. Tzovaras, C. Ziogou, and S. Voutetakis. ICE/ITMC, page 454-461. IEEE, (2017)Occupancy Inference Through Energy Consumption Data: A Smart Home Experiment.A. Chouliara, K. Peppas, A. Tsolakis, T. Vafeiadis, S. Krinidis, and D. Tzovaras. ICVS, volume 11754 of Lecture Notes in Computer Science, page 670-679. Springer, (2019)Fault Diagnosis in Microelectronics Attachment Via Deep Learning Analysis of 3-D Laser Scans.N. Dimitriou, L. Leontaris, T. Vafeiadis, D. Ioannidis, T. Wotherspoon, G. Tinker, and D. Tzovaras. IEEE Trans. Ind. Electron., 67 (7): 5748-5757 (2020)Robust malfunction diagnosis in process industry time series.T. Vafeiadis, S. Krinidis, C. Ziogou, D. Ioannidis, S. Voutetakis, and D. Tzovaras. INDIN, page 111-116. IEEE, (2016)Cognitive analytics platform with AI solutions for anomaly detection.V. Rousopoulou, T. Vafeiadis, A. Nizamis, I. Iakovidis, L. Samaras, A. Kirtsoglou, K. Georgiadis, D. Ioannidis, and D. Tzovaras. Comput. Ind., (2022)

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A generic fault prognostics algorithm for manufacturing industries using unsupervised machine learning classifiers.

Please choose a person to relate this publication to

Viktor Vafeiadis

Other publications of authors with the same name

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Disambiguation of "Vafeiadis, Thanasis"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML A generic fault prognostics algorithm for manufacturing industries using unsupervised machine learning classifiers.

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Viktor Vafeiadis

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A generic fault prognostics algorithm for manufacturing industries using unsupervised machine learning classifiers.