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Disambiguation of "Kishida, Ryo"

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A Novel C-2αC Ladder Based Non-binary DAC for SAR-ADC Using Unit Capacitors.

, , , and . ISPACS, page 457-462. IEEE, (2018)

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Ryo Sugihara

Ryo Kohsaka

Jong Won Ryoo

Mun Il Ryoo

So Young Ryou

 

Other publications of authors with the same name

Digital Calibration Algorithm of Conversion Error Influenced by Parasitic Capacitance in C-C SAR-ADC Based on γ-Estimation., , , and . IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 104-A (2): 516-524 (2021)Compact Modeling of NBTI Replicating AC Stress / Recovery from a Single-shot Long-term DC Measurement., , , , and . IOLTS, page 305-309. IEEE, (2019)Universal NBTI Compact Model Replicating AC Stress/Recovery from a Single-shot Long-term DC Measurement., , , , and . IPSJ Trans. Syst. LSI Des. Methodol., (2020)Investigation of Hybrid ADC Combined with First-order Feedforward Incremental and SAR ADCs., , , and . ISPACS, page 1-2. IEEE, (2019)Bias Temperature Instability Depending on Body Bias through Buried Oxide (BOX) Layer in a 65 nm Fully-Depleted Silicon-On-Insulator Process., , and . IRPS, page 1-6. IEEE, (2021)Circuit-level simulation methodology for Random Telegraph Noise by using Verilog-AMS., , , , , and . ICICDT, page 1-4. IEEE, (2017)Correlations between BTI-Induced Degradations and Process Variations on ASICs and FPGAs., , and . IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 97-A (12): 2367-2372 (2014)Negative bias temperature instability caused by plasma induced damage in 65 nm bulk and Silicon on thin BOX (SOTB) processes., , and . IRPS, page 2. IEEE, (2015)Temperature Dependence of Bias Temperature Instability (BTI) in Long-term Measurement by BTI-sensitive and -insensitive Ring Oscillators Removing Environmental Fluctuation., , , and . ASICON, page 1-4. IEEE, (2019)A Novel C-2αC Ladder Based Non-binary DAC for SAR-ADC Using Unit Capacitors., , , and . ISPACS, page 457-462. IEEE, (2018)