Author of the publication

An approach to linear model-based testing for nonlinear cascaded mixed-signal systems.

, , , , and . DATE, page 1662-1667. IEEE, (2009)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

Model-based testing of high-resolution ADCs., and . ISCAS, page 335-338. IEEE, (2000)Overcoming Test Setup Limitations by Applying Model-Based Testing to High-Precision ADCs., and . J. Electron. Test., 21 (3): 299-310 (2005)Test Development Through Defect and Test Escape Level Estimation for Data Converters., and . J. Electron. Test., 22 (4-6): 313-324 (2006)Innovation to overcome limitations of test equipment., and . ECCTD, page 309-314. IEEE, (2005)Linear Model-Based Error Identification and Calibration for Data Converters., and . DATE, page 10630-10635. IEEE Computer Society, (2003)Hard-Fault Detection and Diagnosis During the Application of Model-Based Data Converter Testing., and . J. Electron. Test., 23 (6): 513-525 (2007)Testing ADCs for static and dynamic INL - killing two birds with one stone., and . Comput. Stand. Interfaces, 26 (1): 15-20 (2004)Combining the Standard Histogram Method and a Stimulus Identification Algorithm for A/D Converter INL Testing With a Low-Quality Sine Wave Stimulus., , and . IEEE Trans. Circuits Syst. I Regul. Pap., 57-I (6): 1166-1174 (2010)Guest Editorial: Analog, Mixed-Signal and RF Testing., and . J. Electron. Test., 32 (4): 405-406 (2016)Incorporation of Hard-Fault-Coverage in Model-Based Testing of Mixed-Signal ICs., and . DATE, page 765. IEEE Computer Society / ACM, (2000)