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Intra-Cell Defects Diagnosis., , , , , , and . J. Electron. Test., 30 (5): 541-555 (2014)Random Adjacent Sequences: An Efficient Solution for Logic BIST., , , , and . VLSI-SOC, volume 218 of IFIP Conference Proceedings, page 413-424. Kluwer, (2001)Scan Cell Reordering for Peak Power Reduction during Scan Test Cycles., , , , and . VLSI-SoC, volume 240 of IFIP, page 267-281. Springer, (2005)A non-iterative gate resizing algorithm for high reduction in power consumption., , , and . Integr., 24 (1): 37-52 (1997)On hardware generation of random single input change test sequences., , , , and . ETW, page 117-123. IEEE Computer Society, (2001)A two-layer SPICE model of the ATMEL TSTACTM eFlash memory technology for defect injection and faulty behavior prediction., , , , , , , , and . European Test Symposium, page 81-86. IEEE Computer Society, (2010)Analysis of resistive-bridging defects in SRAM core-cells: A comparative study from 90nm down to 40nm technology nodes., , , , , , and . European Test Symposium, page 132-137. IEEE Computer Society, (2010)A Selective Scan Slice Encoding Technique for Test Data Volume and Test Power Reduction., , , , , , and . J. Electron. Test., 24 (4): 353-364 (2008)Analysis of Dynamic Faults in Embedded-SRAMs: Implications for Memory Test., , , , , and . J. Electron. Test., 21 (2): 169-179 (2005)Parity prediction synthesis for nano-electronic gate designs., , , , , , and . ITC, page 820. IEEE Computer Society, (2010)