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Logic circuit design using monostable-bistable transition logic element based on standard BiCMOS process.

, , , and . Microelectron. J., 42 (2): 477-482 (2011)

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The impact of interface/border defect on performance and reliability of high-k/metal-gate CMOSFET., , , , and . Microelectron. Reliab., 53 (2): 265-269 (2013)Design of AND and NAND Logic Gate Using NDR-BASED Circuit Suitable for CMOS Process., , , , and . APCCAS, page 1325-1328. IEEE, (2006)Logic circuit design using monostable-bistable transition logic element based on standard BiCMOS process., , , and . Microelectron. J., 42 (2): 477-482 (2011)Novel Multiple-Valued Logic Design Using BiCMOS-Based Negative Differential Resistance Circuit Biased by Two Current Sources., , and . IEICE Trans. Inf. Syst., 93-D (8): 2068-2072 (2010)New D-Type Flip-Flop Design Using Negative Differential Resistance Circuits., and . DELTA, page 258-261. IEEE Computer Society, (2008)Four-Valued Memory Circuit Designed by Multiple-Peak MOS-NDR Devices and Circuits., , , , , , , , , and . IWSOC, page 78-81. IEEE Computer Society, (2005)Multiple-Valued Memory Design by Standard BiCMOS Technique., , , , , , and . CSIE (3), page 596-599. IEEE Computer Society, (2009)Logic Circuit Design Based on MOS-NDR Devices and Circuits Fabricated by CMOS Process., , , , , , , , and . IWSOC, page 392-395. IEEE Computer Society, (2005)Novel Voltage-Controlled Oscillator Design by MOS-NDR Devices and Circuits., , , , , , , , and . IWSOC, page 372-375. IEEE Computer Society, (2005)Standard BiCMOS Implementation of a Two-Peak Negative Differential Resistance Circuit with High and Adjustable Peak-to-Valley Current Ratio., , , and . IEICE Trans. Electron., 92-C (5): 635-638 (2009)