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Другие публикации лиц с тем же именем

Soft Error Issues with Scaling Technologies., , , , , и . Asian Test Symposium, стр. 68. IEEE Computer Society, (2012)Reliability of Industrial grade Embedded-STT-MRAM., , , , , , , , , и 21 other автор(ы). IRPS, стр. 1-3. IEEE, (2020)