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On the Properties of Sensitized Paths., and . IEEE Trans. Computers, 28 (3): 268-269 (1979)Design of diagnosable sequential machines., and . AFIPS Spring Joint Computing Conference, volume 30 of AFIPS Conference Proceedings, page 713-718. AFIPS / ACM / Thomson Book Company, Washington D.C., (1967)Sequential Fault Diagnosis in Combinational Networks., and . IEEE Trans. Computers, 26 (4): 334-342 (1977)Fault Detection in Fanout-Free Combinational Networks., and . IEEE Trans. Computers, 22 (10): 908-914 (1973)A limited exponential complexity algorithm for increasing the testability of digital circuits by testing-module insertion., and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 11 (2): 247-259 (1992)Decomposition of sequential machines, and . SWCT, page 52-61. IEEE Computer Society, (1965)Synthesis of Multiple Sequential Machines, and . SWAT, page 160-171. IEEE Computer Society, (1966)Machine Distinguishing Experiments., , and . Comput. J., 16 (2): 141-147 (1973)Polynomial Complexity Algorithms for Increasing the Testability of Digital Circuits by Testing Module Insertion., and . IEEE Trans. Computers, 40 (11): 1198-1214 (1991)