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Modeling Fault Coverage of Random Test Patterns., , and . J. Electron. Test., 19 (3): 271-284 (2003)Maximum Distance Sub-Lattice Problem., , and . CoRR, (2018)Critically indecomposable graphs., and . Discret. Appl. Math., 157 (1): 149-163 (2009)Indirect Symbolic Correlation Approach to Unsegmented Text Recognition., , , and . CVPR Workshops, page 22. IEEE Computer Society, (2003)Symbolic Path Sensitization Analysis and Applications., , and . ATS, page 439-444. IEEE, (2007)Synthesis for Testability by Two-Clock Control., , and . VLSI Design, page 279-283. IEEE Computer Society, (1997)Empirical Computation of Reject Ratio in VLSI Testing., and . VLSI Design, page 506-511. IEEE Computer Society, (1999)Implied Set Closure and Its Application to Memory Consistency Verification., , and . CAV, volume 5123 of Lecture Notes in Computer Science, page 94-106. Springer, (2008)Design Verification and Functional Testing of FiniteState Machines., , , and . VLSI Design, page 189-195. IEEE Computer Society, (2001)Exploiting don't cares to enhance functional tests., , , and . ITC, page 538-546. IEEE Computer Society, (2000)