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Accelerated reliability growth testing and data analysis method

. Annual Reliability and Maintainability Symposium 2006, 0, page 385--391. Los Alamitos, CA, USA, IEEE Computer Society, (2006)
DOI: http://doi.ieeecomputersociety.org/10.1109/RAMS.2006.1677405

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Accelerated reliability growth testing and data analysis method. Annual Reliability and Maintainability Symposium 2006, 0, page 385--391. Los Alamitos, CA, USA, IEEE Computer Society, (2006)