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Sampling of populations, and . Wiley series in probability and statistics Wiley, New York, NY u.a., 3. ed edition, (1999)Power-down integrated circuit built-in self-test structures.. VTS, page 30-33. IEEE Computer Society, (1991)Designing in Power-Down Test Circuits.. IEEE Des. Test Comput., 8 (3): 31-35 (1991)Sampling of populations, and . A Wiley-Interscience publication Wiley, New York, NY u.a., (1991)Power-Down Structures for BIST.. ICCD, page 266-269. IEEE Computer Society, (1991)