Author of the publication

Accurate prediction of the impact of on-chip inductance on interconnect delay using electrical and physical parameter-based RSF.

, , , , , , , and . ASP-DAC, page 149-155. ACM, (2003)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

A Practical Gate Resizing Technique Considering Glitch Reduction for Low Power Design., , and . DAC, page 446-451. ACM Press, (1999)Reliability Exploration of System-on-Chip With Multi-Bit-Width Accelerator for Multi-Precision Deep Neural Networks., , , , , , and . IEEE Trans. Circuits Syst. I Regul. Pap., 70 (10): 3978-3991 (October 2023)An Average-Performance-Oriented Subthreshold Processor Self-Timed by Memory Read Completion., , , and . IEEE Trans. Circuits Syst. II Express Briefs, 58-II (5): 299-303 (2011)Statistical Timing Analysis Considering Spatially and Temporally Correlated Dynamic Power Supply Noise., , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 28 (4): 541-553 (2009)A Body Bias Clustering Method for Low Test-Cost Post-Silicon Tuning., , and . IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 95-A (12): 2292-2300 (2012)Field Slack Assessment for Predictive Fault Avoidance on Coarse-Grained Reconfigurable Devices., , , , , and . IEICE Trans. Inf. Syst., 96-D (8): 1624-1631 (2013)Quantitative Prediction of On-Chip Capacitive and Inductive Crosstalk Noise and Tradeoff between Wire Cross-Sectional Area and Inductive Crosstalk Effect., , and . IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 90-A (4): 724-731 (2007)Transistor Sizing of LCD Driver Circuit for Technology Migration., , , , and . IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 90-A (12): 2712-2717 (2007)Accuracy Enhancement of Grid-Based SSTA by Coefficient Interpolation., and . IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 93-A (12): 2441-2446 (2010)Analyzing Impacts of SRAM, FF and Combinational Circuit on Chip-Level Neutron-Induced Soft Error Rate., and . IEICE Trans. Electron., 102-C (4): 296-302 (2019)