( en | de | ru )

 

Disambiguation of "Kochte, Michael A."

Author of the publication

copydeleteadd this publication to your clipboard
Test Set Stripping Limiting the Maximum Number of Specified Bits.

, , , and . DELTA, page 581-586. IEEE Computer Society, (2008)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Eckhard Artur Kochte

Barbara Kochte-Clemens

Michael A Linseis

Michael A Meer

-Michael A Scherer

 

Other publications of authors with the same name

Self-Test and Diagnosis for Self-Aware Systems., and . IEEE Des. Test, 35 (5): 7-18 (2018)Efficient BDD-based Fault Simulation in Presence of Unknown Values., , , , and . Asian Test Symposium, page 383-388. IEEE Computer Society, (2011)Autonomous Testing for 3D-ICs with IEEE Std. 1687., , , and . ATS, page 215-220. IEEE Computer Society, (2016)Test Set Stripping Limiting the Maximum Number of Specified Bits., , , and . DELTA, page 581-586. IEEE Computer Society, (2008)Power-aware test generation with guaranteed launch safety for at-speed scan testing., , , , , , , and . VTS, page 166-171. IEEE Computer Society, (2011)An on-chip self-test architecture with test patterns recorded in scan chains., , and . ITC, page 1-10. IEEE, (2016)Efficient fault simulation on many-core processors., , , and . DAC, page 380-385. ACM, (2010)Structure-Oriented Test of Reconfigurable Scan Networks., , and . ATS, page 127-132. IEEE Computer Society, (2017)Variation-Aware Small Delay Fault Diagnosis on Compressed Test Responses., , , , and . ITC, page 1-10. IEEE, (2019)LCTI-SS: Low-Clock-Tree-Impact Scan Segmentation for Avoiding Shift Timing Failures in Scan Testing., , , , , and . IEEE Des. Test, 30 (4): 60-70 (2013)