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Study of the effects of SET induced faults on submicron technologies.

, and . DSN Workshops, page 41-46. IEEE Computer Society, (2011)

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Two soft-error mitigation techniques for functional units of DSP processors., and . ETS, page 1-6. IEEE, (2014)A Technique for Accelerating Injection of Transient Faults in Complex SoCs., and . DSD, page 213-220. IEEE Computer Society, (2011)On the maximization of the sustained switching activity in a processor., , , and . IOLTS, page 34-35. IEEE, (2015)Pulse-length determination techniques in the rectangular single event transient fault model., , , and . ICSAMOS, page 213-218. IEEE, (2013)An Analysis of Fault Effects and Propagations in AVR Microcontroller ATmega103(L)., and . ARES, page 166-172. IEEE Computer Society, (2009)A software framework to calculate local temperatures in CMOS processors., , and . PATMOS, page 183-188. IEEE, (2016)Study of the effects of SET induced faults on submicron technologies., and . DSN Workshops, page 41-46. IEEE Computer Society, (2011)A New CLB Architecture for Tolerating SEU in SRAM-Based FPGAs., and . ReConFig, page 83-88. IEEE Computer Society, (2009)An on-line soft error mitigation technique for control logic of VLIW processors., and . DFT, page 85-91. IEEE Computer Society, (2012)Detecting intermittent resistive faults in digital CMOS circuits., , and . DFT, page 87-90. IEEE Computer Society, (2016)