Author of the publication

Dynamic responses and solder joint reliability under board level drop test.

, , , , and . Microelectron. Reliab., 47 (2-3): 450-460 (2007)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

Dynamic responses and solder joint reliability under board level drop test., , , , and . Microelectron. Reliab., 47 (2-3): 450-460 (2007)Board level solder joint reliability analysis and optimization of pyramidal stacked die BGA packages., and . Microelectron. Reliab., 44 (12): 1957-1965 (2004)Design For Board Level Reliability Of A Miniaturized Mems Package: Stacked Die Tqfn., , , , , and . International Journal of Computational Engineering Science, 4 (2): 347-350 (2003)Advances in Wafer Level Packaging (WLP)., , and . Microelectron. Reliab., 50 (4): 479-480 (2010)Comprehensive board-level solder joint reliability modeling and testing of QFN and PowerQFN packages., , , and . Microelectron. Reliab., 43 (8): 1329-1338 (2003)Integrated vapor pressure, hygroswelling, and thermo-mechanical stress modeling of QFN package during reflow with interfacial fracture mechanics analysis., and . Microelectron. Reliab., 44 (1): 105-114 (2004)Board level solder joint reliability modeling and testing of TFBGA packages for telecommunication applications., , , , and . Microelectron. Reliab., 43 (7): 1117-1123 (2003)Impact life prediction modeling of TFBGA packages under board level drop test., , , , and . Microelectron. Reliab., 44 (7): 1131-1142 (2004)Board level solder joint reliability analysis of stacked die mixed flip-chip and wirebond BGA., , and . Microelectron. Reliab., 46 (12): 2131-2138 (2006)Advanced analysis on board trace reliability of WLCSP under drop impact., , , , , and . Microelectron. Reliab., 50 (7): 928-936 (2010)