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Tamper-aware authentication framework for wireless sensor networks.

, , and . IET Wirel. Sens. Syst., 7 (3): 73-81 (2017)

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Multiple Fault Diagnosis in Logic Circuits Using EB Tester and Multiple/Single Fault Simulators., , , and . Asian Test Symposium, page 341-346. IEEE Computer Society, (1999)BIST-Aided Scan Test - A New Method for Test Cost Reduction., , , , , , and . VTS, page 359-364. IEEE Computer Society, (2003)Design of C-Testable Multipliers Based on the Modified Booth Algorithm., , and . Asian Test Symposium, page 42-47. IEEE Computer Society, (1997)PSTRM: Privacy-aware sociopsychological trust and reputation model for wireless sensor networks., , and . Peer-to-Peer Netw. Appl., 13 (5): 1505-1525 (2020)A New Method for Diagnosing Multiple Stuck-at Faults using Multiple and Single Fault Simulations., , and . VTS, page 64-69. IEEE Computer Society, (1999)A Retrofit Design Science Methodology for Smart Metering Design in Developing Countries., and . ICCSA (Short Papers/poster papers/PhD student showcase works), page 1-7. IEEE Computer Society, (2015)The adoption of socio- and bio-inspired algorithms for trust models in wireless sensor networks: A survey., , and . Int. J. Commun. Syst., (2018)General BIST-Amenable Method of Test Generation for Iterative Logic Arrays., , and . VTS, page 171-178. IEEE Computer Society, (2000)On diagnosing multiple stuck-at faults using multiple and singlefault simulation in combinational circuits., , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 21 (3): 362-368 (2002)A Method of Generating Tests for Marginal Delays an Delay Faults in Combinational Circuits., , , and . Asian Test Symposium, page 320-325. IEEE Computer Society, (1997)