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3D chip package interaction thermo-mechanical challenges: Proximity effects of Through Silicon vias and μ-bumps., , , , , , , , , и 9 other автор(ы). ICICDT, стр. 1-4. IEEE, (2012)Active-lite interposer for 2.5 & 3D integration., , , , , , , , , и 5 other автор(ы). VLSIC, стр. 222-. IEEE, (2015)In-tier diagnosis of power domains in 3D TSV ICs., , , , , , , , , и 1 other автор(ы). 3DIC, стр. 1-6. IEEE, (2011)Processing active devices on Si interposer and impact on cost., , , , , , , , , и . 3DIC, стр. TS11.2.1-TS11.2.4. IEEE, (2015)Analysis of microbump induced stress effects in 3D stacked IC technologies., , , , , , , , , и 9 other автор(ы). 3DIC, стр. 1-5. IEEE, (2011)3D stacking using ultra thin dies., , , , , , и . 3DIC, стр. 1-5. IEEE, (2011)3D stacking using Cu-Cu direct bonding., , , , , , , , и . 3DIC, стр. 1-4. IEEE, (2011)