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Resolving Signal Correlations for Estimating Maximum Currents in CMOS Combinational Circuits.

, , , and . DAC, page 384-388. ACM Press, (1993)

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Transition density: a new measure of activity in digital circuits.. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 12 (2): 310-323 (1993)Pattern independent maximum current estimation in power and ground buses of CMOS VLSI circuits: Algorithms, signal correlations, and their resolution., , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 14 (8): 998-1012 (1995)A Linear-Time Approach for Static Timing Analysis Covering All Process Corners., and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 27 (7): 1291-1304 (2008)Fast simulation-based verification of RC power grids., and . CCECE, page 1-6. IEEE, (2016)High-level area estimation., and . ISLPED, page 271-274. ACM, (2002)Modeling and Estimation of Full-Chip Leakage Current Considering Within-Die Correlation., , and . DAC, page 93-98. IEEE, (2007)Clock skew optimization via wiresizing for timing sign-off covering all process corners., , and . DAC, page 196-201. ACM, (2009)Fast vectorless power grid verification using an approximate inverse technique., and . DAC, page 184-189. ACM, (2009)An adaptive FPGA architecture with process variation compensation and reduced leakage., , and . DAC, page 624-629. ACM, (2006)Probabilistic simulation for reliability analysis of VLSI circuits. University of Illinois Urbana-Champaign, USA, (1989)