( en | de | ru )

 

Disambiguation of "Bollen, Math H. J."

Author of the publication

copydeleteadd this publication to your clipboard
The Smart Grid: Adapting the Power System to New Challenges

. Synthesis Lectures on Power Electronics Morgan & Claypool Publishers, (2011)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

H J Plüss

H -J Bielig

J. H. Merkin

J H Mazaheri

H J Reeb

 

Other publications of authors with the same name

A Generic Storage Model Based on a Future Cost Piecewise-Linear Approximation., , , , and . IEEE Trans. Smart Grid, 10 (1): 878-888 (2019)Solar power in northern Scandinavia, its impact on the grid and methods to mitigate this impact., and . ISGT Europe, page 1-5. IEEE, (2013)Physical-hybrid simulation for in-situ evaluation of energy storage system., , and . ISGT Europe, page 1-7. IEEE, (2012)Quantification of ancillary services from a virtual power plant in an existing subtransmision network., , and . ISGT Europe, page 1-5. IEEE, (2013)The Smart Grid: Adapting the Power System to New Challenges. Synthesis Lectures on Power Electronics Morgan & Claypool Publishers, (2011)Simple diagnostic technique of switch failure modes of VSI power converter., and . ISGT Europe, page 1-6. IEEE, (2017)Overload and overvoltage in low-voltage and medium-voltage networks due to renewable energy - Some illustrative case studies., and . ISGT Europe, page 1-8. IEEE, (2011)Classification of industrial customers regarding sensitivity towards interruptions., , , , and . ISGT Europe, page 1-8. IEEE, (2010)Classification of Underlying Causes of Power Quality Disturbances: Deterministic versus Statistical Methods., , , and . EURASIP J. Adv. Signal Process., (2007)Characterizing Failure and Repair Time of Servers in a Hyper-scale Data Center., , and . ISGT-Europe, page 660-664. IEEE, (2020)