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An 11-nW CMOS Temperature-to-Digital Converter Utilizing Sub-Threshold Current at Sub-Thermal Drain Voltage.

, , , and . IEEE J. Solid State Circuits, 54 (3): 613-622 (2019)

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Characterization and compensation of performance variability using on-chip monitors., and . VLSI-DAT, page 1-4. IEEE, (2014)A body bias generator with wide supply-range down to threshold voltage for within-die variability compensation., , , and . A-SSCC, page 53-56. IEEE, (2014)On-Chip Detection of Process Shift and Process Spread for Post-Silicon Diagnosis and Model-Hardware Correlation., and . IEICE Trans. Inf. Syst., 96-D (9): 1971-1979 (2013)On-Chip Detection of Process Shift and Process Spread for Silicon Debugging and Model-Hardware Correlation., and . Asian Test Symposium, page 350-354. IEEE Computer Society, (2012)Circuit Techniques for Device-Circuit Interaction toward Minimum Energy Operation., and . IPSJ Trans. Syst. LSI Des. Methodol., (2019)CNN-based Approach for Estimating Degradation of Power Devices by Gate Waveform Monitoring., , , , , and . ICICDT, page 1-4. IEEE, (2019)PVT2: process, voltage, temperature and time-dependent variability in scaled CMOS process., and . ICCAD, page 126. ACM, (2018)Drive-Strength Selection for Synthesis of Leakage-Dominant Circuits., , , and . ISQED, page 298-303. IEEE, (2019)Wide-supply-range all-digital leakage variation sensor for on-chip process and temperature monitoring., , , and . A-SSCC, page 45-48. IEEE, (2014)A 13nW temperature-to-digital converter utilizing sub-threshold MOSFET operation at sub-thermal drain voltage., , , and . CICC, page 1-4. IEEE, (2018)