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Improvement of Hump Phenomenon of Thin-Film Transistor by SiNX Film., , , and . IEICE Trans. Electron., 97-C (11): 1112-1116 (2014)Evaluation of the Impact of Selfish Nodes in Ad Hoc Networks and Detection and Countermeasure Methods., , , and . MDM, page 95. IEEE Computer Society, (2006)Hybrid Integration of Photonic Devices and CMOS Amplifiers., , , , , , and . ISDCS, page 1-3. IEEE, (2019)Study of charge retention mechanism for DNA memory FET., , , , , , , and . IEICE Electron. Express, 11 (5): 20130900 (2014)Fabrication of tunneling dielectric thin-film transistor with very thin SiNx films onto source and drain., , , , and . IEICE Electron. Express, 4 (14): 442-447 (2007)Response Characteristics of Optical Waveguides Containing Diarylethene : * Note: Sub-titles are not captured in Xplore and should not be used., , and . ISDCS, page 1-3. IEEE, (2019)Heterogeneous integration of GaN device layer by epitaxial film bonding., , and . ISDCS, page 1-3. IEEE, (2019)Effect of Anti-Reflective Coating for Si Optical Resonator Biosensors., , , and . ISDCS, page 1-3. IEEE, (2019)Atomic-layer-deposited silicon-nitride/SiO2 stack--a highly potential gate dielectrics for advanced CMOS technology., , , and . Microelectron. Reliab., 42 (12): 1823-1835 (2002)Proposal for a Quantitative Skill Risk Evaluation Method Using Fault Tree Analysis., and . IEEE Trans. Engineering Management, 62 (2): 266-279 (2015)