( en | de | ru )

 

Disambiguation

From post

копироватьудалитьдобавить публикацию в буфер
Aspect sentiment mining of short bullet screen comments from online TV series.

, , , , и . J. Assoc. Inf. Sci. Technol., 74 (8): 1026-1045 (августа 2023)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed.

Ziyao Gao

Zhou Zhou

Zhou Zhou

Yayun Zhou

Yaming Zhou

 

Другие публикации лиц с тем же именем

A Magnetoelectric Compass for In-Plane AC Magnetic Field Detection., , , , , , , , , и . IEEE Trans. Ind. Electron., 68 (4): 3527-3536 (2021)Effects of trust in human-automation shared control: A human-in-the-loop driving simulation study., , , , , и . ITSC, стр. 1147-1154. IEEE, (2021)Fewer Steps the Better? Instructing Older Adults' Learning and Searching in Smartphone Apps., , и . Int. J. Hum. Comput. Interact., 38 (9): 789-800 (2022)Developing and evaluating an human-automation shared control takeover strategy based on Human-in-the-loop driving simulation., , , и . CoRR, (2021)Study on the Control-Display Gain of Touch Zoom Gestures for Older Adults., и . HCI (25), том 12786 из Lecture Notes in Computer Science, стр. 321-332. Springer, (2021)Adaptive deep feature aggregation using Fourier transform and low-pass filtering for robust object retrieval., , , , и . J. Vis. Commun. Image Represent., (2020)Aspect sentiment mining of short bullet screen comments from online TV series., , , , и . J. Assoc. Inf. Sci. Technol., 74 (8): 1026-1045 (августа 2023)Older adults' prevention and communication to beat anxiety: the diminishing utility of proactive coping actions., , , и . Univers. Access Inf. Soc., 22 (4): 1425-1444 (ноября 2023)Small screen-big information challenge for older adults: a study on visual momentum and gesture navigation., и . Behav. Inf. Technol., 42 (6): 744-757 (апреля 2023)Magnetic Sensor Based on Giant Magneto-Impedance in Commercial Inductors., , , , , , , , и . IEEE Trans. Ind. Electron., 68 (8): 7577-7583 (2021)