Author of the publication

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

An Optimized Test During Burn-In for Automotive SoC., , , , , , , and . IEEE Des. Test, 35 (3): 46-53 (2018)Accelerated Analysis of Simulation Dumps through Parallelization on Multicore Architectures., , , , , , , and . DDECS, page 69-74. IEEE, (2021)Test Considerations about the Structured ASIC Paradigm., and . DDECS, page 232-233. IEEE Computer Society, (2006)Parallel Multithread Analysis of Extremely Large Simulation Traces., , , , , , and . IEEE Access, (2022)An Adaptive Low-Cost Tester Architecture Supporting Embedded Memory Volume Diagnosis., and . IEEE Trans. Instrum. Meas., 61 (4): 1002-1018 (2012)An Effective Technique for the Automatic Generation of Diagnosis-Oriented Programs for Processor Cores., , , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 27 (3): 570-574 (2008)A BIST-based Solution for the Diagnosis of Embedded Memories Adopting Image Processing Techniques., , , , , , and . J. Electron. Test., 20 (1): 79-87 (2004)Increasing the Fault Coverage of Processor Devices during the Operational Phase Functional Test., , , , and . J. Electron. Test., 30 (3): 317-328 (2014)Exploring the Mysteries of System-Level Test., , , , , , , , , and . CoRR, (2021)A novel SEU injection setup for Automotive SoC., , , , , , , and . ISIE, page 623-626. IEEE, (2022)