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Disambiguation of "Liu, Kunyang"

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A 100-Bit-Output Modeling Attack-Resistant SPN Strong PUF with Uniform and High-Randomness Response.

, , , , and . CICC, page 1-2. IEEE, (2023)

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Liu Liu

Liu Liu

Liu Liu

Yan Liu

Yifei Liu

 

Other publications of authors with the same name

A 0.186-pJ per Bit Latch-Based True Random Number Generator with Mismatch Compensation and Random Noise Enhancement., , , , , , and . VLSI Circuits, page 1-2. IEEE, (2021)Practical Markov Chain and Von Neumann based Post-processing Circuits for True Random Number Generators., , , , , and . MWSCAS, page 841-845. IEEE, (2023)A 2.17-pJ/b 5b-Response Attack-Resistant Strong PUF with Enhanced Statistical Performance., , , , and . ESSCIRC, page 513-516. IEEE, (2022)A 0.116 pJ/bit Latch-Based True Random Number Generator Featuring Static Inverter Selection and Noise Enhancement., , , and . IEEE Trans. Very Large Scale Integr. Syst., 32 (3): 564-572 (March 2024)A 0.116pJ/bit Latch-Based True Random Number Generator with Static Inverter Selection and Noise Enhancement., , , , , and . VLSI-DAT, page 1-4. IEEE, (2022)A 0.186-pJ per Bit Latch-Based True Random Number Generator Featuring Mismatch Compensation and Random Noise Enhancement., , , and . IEEE J. Solid State Circuits, 57 (8): 2498-2508 (2022)A 100-Bit-Output Modeling Attack-Resistant SPN Strong PUF with Uniform and High-Randomness Response., , , , and . CICC, page 1-2. IEEE, (2023)An Inverter-Based True Random Number Generator with 4-bit Von-Neumann Post-Processing Circuit., , , , and . MWSCAS, page 285-288. IEEE, (2020)A 373-F2 0.21%-Native-BER EE SRAM Physically Unclonable Function With 2-D Power-Gated Bit Cells and $V_SS$ Bias-Based Dark-Bit Detection., , , , and . IEEE J. Solid State Circuits, 55 (6): 1719-1732 (2020)A 0.5-V Hybrid SRAM Physically Unclonable Function Using Hot Carrier Injection Burn-In for Stability Reinforcement., , , and . IEEE J. Solid State Circuits, 56 (7): 2193-2204 (2021)