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Disambiguation of "Czysz, Dariusz"

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Low-Power Scan Operation in Test Compression Environment.

, , , , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 28 (11): 1742-1755 (2009)

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Wolfgang Czysz

Hans-Jürgen Czysz

Dariusz Wawro

Dariusz Zakrzewicz

Dariusz Wolany

 

Other publications of authors with the same name

Low Power Scan Shift and Capture in the EDT Environment., , , , , and . ITC, page 1-10. IEEE Computer Society, (2008)Compression based on deterministic vector clustering of incompatible test cubes., , , , and . ITC, page 1-10. IEEE Computer Society, (2009)Low power compression of incompatible test cubes., , , , , and . ITC, page 704-713. IEEE Computer Society, (2010)Reduced ATE Interface for High Test Data Compression., , , , and . ETS, page 99-104. IEEE Computer Society, (2011)New Test Data Decompressor for Low Power Applications., , , and . DAC, page 539-544. IEEE, (2007)Low-Power Scan Operation in Test Compression Environment., , , , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 28 (11): 1742-1755 (2009)Low power test application with selective compaction in VLSI designs., , and . ITC, page 1-10. IEEE Computer Society, (2012)On Compaction Utilizing Inter and Intra-Correlation of Unknown States., , , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 29 (1): 117-126 (2010)Highly X-Tolerant Selective Compaction of Test Responses., , , , and . VTS, page 245-250. IEEE Computer Society, (2009)Low-Power Test Data Application in EDT Environment Through Decompressor Freeze., , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 27 (7): 1278-1290 (2008)