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An On-Chip IEEE 1687 Network Controller for Reliability and Functional Safety Management of System-on-Chips.

, and . ITC-Asia, page 109-114. IEEE, (2019)

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BASTION: Board and SoC test instrumentation for ageing and no failure found., , , , , , , , and . DATE, page 115-120. IEEE, (2017)Investigation of Intermittent Resistive Faults in Digital CMOS Circuits., and . Journal of Circuits, Systems, and Computers, 25 (3): 1640023:1-1640023:17 (2016)Applying IJTAG-compatible embedded instruments for lifetime enhancement of analog front-ends of cyber-physical systems., , , , and . VLSI-SoC, page 1-6. IEEE, (2017)Rapid transient fault insertion in large digital systems., and . Microprocess. Microsystems, 37 (2): 147-154 (2013)Configurations for IDDQ-Testable PLAs., and . IEEE Des. Test Comput., 16 (2): 58-65 (1999)Block-level bayesian diagnosis of analogue electronic circuits., , , and . DATE, page 1767-1772. IEEE Computer Society, (2010)Online digital offset voltage compensation method for AMR sensors., and . I2MTC, page 1512-1515. IEEE, (2015)Online digital compensation Method for AMR sensors., and . VLSI-SoC, page 1-6. IEEE, (2016)A performance analysis tool for performance-driven micro-cell generation., , , and . EURO-DAC, page 576-580. EEE Computer Society, (1991)Design for Delay Testability in High-Speed Digital ICs., , , and . J. Electron. Test., 17 (3-4): 225-231 (2001)