( en | de | ru )

 

Disambiguation of "Tong, Zhou"

Author of the publication

copydeleteadd this publication to your clipboard
A comparative study of SDN and adaptive routing on dragonfly networks.

, , , , and . SC, page 51. ACM, (2017)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Tong Tong

Zhou Zhou

Zhou Zhou

Willi Tönges

Elisabeth Tönges

 

Other publications of authors with the same name

Correction to "quality evaluation for a coprime factor perturbed model set based on frequency-domain data".. IEEE Trans. Automat. Contr., 47 (1): 202 (2002)Vibration Controllability of Flexible Robot-Payload Systems., , and . ICRA, page 1484-1489. IEEE, (2000)Sensitivity Penalization Based Robust State Estimation for Uncertain Linear Systems.. IEEE Trans. Automat. Contr., 55 (4): 1018-1024 (2010)On the Stability of Spatially Distributed Systems.. IEEE Trans. Automat. Contr., 53 (10): 2385-2391 (2008)Nursing Informatics Research Trends: Findings from an International Survey., , , , , , , , , and 16 other author(s). Nursing Informatics, volume 284 of Studies in Health Technology and Informatics, page 344-349. IOS Press, (2021)Enhancing Large Language Models with Pseudo- and Multisource- Knowledge Graphs for Open-ended Question Answering., , , , and . CoRR, (2024)Frequency Domain Identifiability and Sloppiness of Descriptor Systems with an LFT Structure.. CoRR, (2022)Improved Sales Forecasting using Trend and Seasonality Decomposition with LightGBM.. CoRR, (2023)Influence of Secondary Constructions on Transverse Forces of Linear Induction Motors in Curve Rails for Urban Rail Transit., , , and . IEEE Trans. Ind. Electron., 66 (6): 4231-4239 (2019)Influence of the Ladder-Slit Secondary on Reducing the Edge Effect and Transverse Forces in the Linear Induction Motor., , and . IEEE Trans. Ind. Electron., 65 (9): 7516-7525 (2018)