( en | de | ru )

 

Disambiguation of "Hamdioui, Said"

Author of the publication

copydeleteadd this publication to your clipboard
Boolean logic gate exploration for memristor crossbar.

, , , , and . DTIS, page 1-6. IEEE, (2016)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Said Hamdioui

Said Es-Said

Said Al-Said

Saroit Anis Said

Nawal Khurshid Said

 

Other publications of authors with the same name

RESCUE: Interdependent Challenges of Reliability, Security and Quality in Nanoelectronic Systems., , , , , , , , , and 8 other author(s). CoRR, (2019)Memristor-Based Lightweight Encryption., , , , , , and . DSD, page 634-641. IEEE, (2023)Emerging Computing Devices: Challenges and Opportunities for Test and Reliability*., , , , , , , , , and 2 other author(s). ETS, page 1-10. IEEE, (2021)RRAM Crossbar-Based Fault-Tolerant Binary Neural Networks (BNNs)., , and . ETS, page 1-2. IEEE, (2022)Smart Redundancy Schemes for ANNs Against Fault Attacks., , and . ETS, page 1-2. IEEE, (2022)Characterization and Test of Intermittent Over RESET in RRAMs., , , , , , , , and . ATS, page 1-6. IEEE, (2023)Dealing with Non-Idealities in Memristor Based Computation-In-Memory Designs., , , , and . VLSI-SoC, page 1-6. IEEE, (2022)System Design for Computation-in-Memory: From Primitive to Complex Functions., , , , , and . VLSI-SoC, page 1-6. IEEE, (2022)A DFT Scheme to Improve Coverage of Hard-to-Detect Faults in FinFET SRAMs., , , , , , and . DATE, page 792-797. IEEE, (2020)Applying Thermal Side-Channel Attacks on Asymmetric Cryptography., , , , and . IEEE Trans. Very Large Scale Integr. Syst., 29 (11): 1930-1942 (2021)