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HTOL SRAM Vmin shift considerations in scaled HKMG technologies.

S. Balasubramanian, V. Joshi, T. Klick, R. Mann, J. Versaggi, A. Gautam, C. Weintraub, G. Kurz, G. Krause, A. Kerber, B. Parameshwaran, and T. Nigam. CICC, page 1-4. IEEE, (2014)

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Randy Jäger

Randy Eichin

Randy Kurz

Randy Koch

Randy J Lapolla

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Sub-threshold Circuit Design with Shrinking CMOS Devices.B. Calhoun, S. Khanna, R. Mann, and J. Wang. ISCAS, page 2541-2544. IEEE, (2009)New category of ultra-thin notchless 6T SRAM cell layout topologies for sub-22nm.R. Mann, and B. Calhoun. ISQED, page 425-430. IEEE, (2011)A half-micron CMOS logic generation.C. III, W. Clark, J. Adkisson, E. Adler, P. Bakeman, A. Bergendahl, A. Botula, W. Chang, B. Davari, J. Givens and 14 other author(s). IBM J. Res. Dev., 39 (1-2): 215-228 (1995)Nonrandom Device Mismatch Considerations in Nanoscale SRAM.R. Mann, T. Hook, P. Nguyen, and B. Calhoun. IEEE Trans. Very Large Scale Integr. Syst., 20 (7): 1211-1220 (2012)An Extrinsic Device and Leakage Mechanism in Advanced Bulk FinFET SRAM.R. Mann, M. Zhao, S. Parihar, Q. Gao, A. Arya, C. Radens, S. Pandey, J. Versaggi, J. Higman, and R. Carter. IEEE Trans. Very Large Scale Integr. Syst., 27 (8): 1819-1827 (2019)Bias-Induced Healing of $V_min$ Failures in Advanced SRAM Arrays.R. Mann, W. McMahon, Y. Randriamihaja, Y. Song, A. Kallianpur, S. Xie, A. Gautam, J. Versaggi, B. Parameshwaran, and C. Weintraub. IEEE Trans. Very Large Scale Integr. Syst., 25 (2): 660-669 (2017)Bias-Dependent Variation in FinFET SRAM.R. Mann, M. Zhao, O. Kwon, X. Cao, S. Parihar, M. Karim, J. Higman, J. Versaggi, and R. Carter. IEEE Trans. Very Large Scale Integr. Syst., 28 (5): 1341-1344 (2020)Improving SRAM Vmin and yield by using variation-aware BTI stress.J. Wang, S. Nalam, Z. Qi, R. Mann, M. Stan, and B. Calhoun. CICC, page 1-4. IEEE, (2010)Limits of bias based assist methods in nano-scale 6T SRAM.R. Mann, S. Nalam, J. Wang, and B. Calhoun. ISQED, page 1-8. IEEE, (2010)HTOL SRAM Vmin shift considerations in scaled HKMG technologies.S. Balasubramanian, V. Joshi, T. Klick, R. Mann, J. Versaggi, A. Gautam, C. Weintraub, G. Kurz, G. Krause, A. Kerber and 2 other author(s). CICC, page 1-4. IEEE, (2014)

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Disambiguation of "Mann, Randy W."

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HTOL SRAM Vmin shift considerations in scaled HKMG technologies.

Please choose a person to relate this publication to

Randy Jäger

Randy Eichin

Randy Kurz

Randy Koch

Randy J Lapolla

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Mann, Randy W."

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML HTOL SRAM Vmin shift considerations in scaled HKMG technologies.

Please choose a person to relate this publication to

Randy Jäger

Randy Eichin

Randy Kurz

Randy Koch

Randy J Lapolla

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
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URL
DOI
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APA
Chicago
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HTOL SRAM Vmin shift considerations in scaled HKMG technologies.