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Другие публикации лиц с тем же именем

Enhancing Testability of System on Chips Using Network Management Protocols., и . DATE, стр. 1370-1371. IEEE Computer Society, (2004)Remote testing and diagnosis of System-on-Chips using network management frameworks., и . DATE, стр. 373-378. EDA Consortium, San Jose, CA, USA, (2007)On-Line Testing in Continuous Operation of Embedded Systems: Modeling and Performance Evaluation.. IOLTW, стр. 138. IEEE Computer Society, (2001)A generic clock controller for low power systems: Experimentation on an AXI bus., , , , , и . VLSI-SoC, стр. 307-312. IEEE, (2015)Design and Test of a Massively Parallel Architecture., , , и . EUROSIM, стр. 187-194. Elsevier, (1994)Test Power Analysis at Register Transfer Level., и . J. Low Power Electron., 4 (3): 402-409 (2008)Scan Insertion at the Behavioral Level.. ITC, стр. 1126. IEEE Computer Society, (1999)On-line Testing of Embedded Systems Using Optical Probes: System Modeling and Probing Technology., , , и . IOLTW, стр. 191. IEEE Computer Society, (2002)An Optical Boundary Scan Cell for On Line Testing of Embedded Systems., , и . Embedded Systems and Applications, стр. 155-160. CSREA Press, (2003)Hierarchical interfaces for hardware software systems., , и . ESM, стр. 647-654. SCS Europe, (2000)