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SRAM delay fault modeling and test algorithm development.

, , , and . ASP-DAC, page 104-109. IEEE Computer Society, (2004)

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Fault Models and Test Methods for Subthreshold SRAMs., , , , , and . IEEE Trans. Computers, 62 (3): 468-481 (2013)A Built-in Self-Diagnosis and Repair Design With Fail Pattern Identification for Memories., , , , and . IEEE Trans. Very Large Scale Integr. Syst., 19 (12): 2184-2194 (2011)MRAM Defect Analysis and Fault Modeli., , , , , , and . ITC, page 124-133. IEEE Computer Society, (2004)A Parallel Built-in Diagnostic Scheme for Multiple Embedded Memories., , , , and . MTDT, page 65-69. IEEE Computer Society, (2004)Testing Methodology of Embedded DRAMs., , , and . ITC, page 1-9. IEEE Computer Society, (2008)A Processor-Based Built-In Self-Repair Design for Embedded Memories., , and . Asian Test Symposium, page 366-371. IEEE Computer Society, (2003)On Test and Diagnostics of Flash Memories., , , , and . Asian Test Symposium, page 260-265. IEEE Computer Society, (2004)Testing Methodology of Embedded DRAMs., , , , and . IEEE Trans. Very Large Scale Integr. Syst., 20 (9): 1715-1728 (2012)Alternate hammering test for application-specific DRAMs and an industrial case study., , , and . DAC, page 1012-1017. ACM, (2012)Fail Pattern Identification for Memory Built-In Self-Repair., , , , , and . Asian Test Symposium, page 366-371. IEEE Computer Society, (2004)