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Disambiguation of "Autran, Jean-Luc"

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On-chip supply power measurement and waveform reconstruction in a 28nm FD-SOI processor SoC.

, , , , , , , , and . A-SSCC, page 125-128. IEEE, (2016)

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Jean-Luc Wolfender

Jean-Luc Rebière

Jean-Luc Boevé

Jean-Luc Régnier

Jean-Luc Wagner

 

Other publications of authors with the same name

Particle Monte Carlo modeling of single-event transient current and charge collection in integrated circuits., , , , , and . Microelectron. Reliab., 54 (9-10): 2278-2283 (2014)3D simulation of single-event-transient effects in symmetrical dual-material double-gate MOSFETs., and . Microelectron. Reliab., 55 (9-10): 1522-1526 (2015)Radiation and COTS at ground level., and . Microelectron. Reliab., 55 (9-10): 2147-2153 (2015)Muons and thermal neutrons SEU characterization of 28nm UTBB FD-SOI and Bulk eSRAMs., , , , and . IRPS, page 2. IEEE, (2015)Soft-Error Rate of Advanced SRAM Memories: Modeling and Monte Carlo Simulation, , , , , and . Numerical Simulation -- From Theory to Industry, chapter 15, InTech, (September 2012)Single-event-transient effects in Junctionless Double-Gate MOSFETs with Dual-Material Gate investigated by 3D simulation., , and . Microelectron. Reliab., (2017)A 2.7pJ/cycle 16MHz SoC with 4.3nW power-off ARM Cortex-M0+ core in 28nm FD-SOI., , , , , and . ESSCIRC, page 153-162. IEEE, (2017)Effect of Temperature on Single Event Latchup Sensitivity., , , , , , , and . DTIS, page 1-5. IEEE, (2020)ASTEP (2005-2015): Ten years of soft error and atmospheric radiation characterization on the Plateau de Bure., , , , , , and . Microelectron. Reliab., 55 (9-10): 1506-1511 (2015)On-chip supply power measurement and waveform reconstruction in a 28nm FD-SOI processor SoC., , , , , , , , and . A-SSCC, page 125-128. IEEE, (2016)