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Disambiguation of "Sanyal, Sayandeep"

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The Notion of Cross Coverage in AMS Design Verification.

, , , , , and . ASP-DAC, page 217-222. IEEE, (2020)

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Monamie Sanyal

Raman Sanyal

Bhaskar Sanyal

 

Other publications of authors with the same name

Methodology for Biasing Random Simulation for Rapid Coverage of Corner Cases in AMS Designs., , , and . CoRR, (2021)The Notion of Cross Coverage in AMS Design Verification., , , , , and . ASP-DAC, page 217-222. IEEE, (2020)The CoveRT Approach for Coverage Management in Analog and Mixed-Signal Integrated Circuits., , , , , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 41 (12): 5695-5708 (2022)Fault Classification and Coverage of Analog Circuits using DC Operating Point and Frequency Response Analysis., , , , and . ACM Great Lakes Symposium on VLSI, page 123-128. ACM, (2019)Tracking Coverage Artefacts for Periodic Signals using Sequence-based Abstractions., , , , , , and . VLSID, page 132-137. IEEE, (2022)Recurrence in Dense-Time AMS Assertions., , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 40 (11): 2416-2420 (2021)CoVerPlan: A Comprehensive Verification Planning Framework Leveraging PSS Specifications., , , and . ACM Trans. Design Autom. Electr. Syst., 28 (1): 9:1-9:32 (January 2023)A Methodology for Identification of Internal Nets for Improving Fault Coverage in Analog and Mixed Signal Circuits., , , and . J. Electron. Test., 36 (6): 719-730 (2020)Accelerating Defect Simulation in Analog and Mixed-Signal Circuits by Parallel Defect Injection., , , and . VLSID, page 325-330. IEEE, (2023)Analog Coverage-driven Selection of Simulation Corners for AMS Integrated Circuits., , , , , , and . DATE, page 1-6. IEEE, (2023)